Fault model

Respond electronic circuits corrupted which can, in principle, have four causes:

Physical errors in digital circuits are divided into several classes.

• Stuck-at faults ( stuck-at fault dt ) are errors in which gates are stuck at an input or output at a certain value. Depending on the value, a distinction stuck-at - one or stuck-at -0 fault.

• As bridging faults shorts between two lines are called. This results in new features of the affected gate. Input-output bridging means that the inputs and outputs of the circuit are connected together ( feedback). This results in time-dependent behavior, e.g. to oscillating circuits.

• Especially when one knows transistors stuck- off error ( transistor blocks always), Stuck -on- error ( transistor conducts always) and gate delay faults as well as path delay faults that cause delays in the signal processing.

By analyzing the circuit, one tries to design effective test scenarios as possible to detect as many errors with minimal effort from the outset. In addition, one can particularly critical circuits fault-tolerant design accordingly. Functionality testing to identify possible errors in production this carried out in the production