PANalytical

PANalytical is a manufacturer of X-ray analysis equipment in X-ray diffraction (XRD) and X-ray fluorescence spectroscopy ( XRF). The company develops and manufactures since 1954 X-ray diffractometer and X-ray fluorescence spectrometer for research, development and production control. The X-ray systems are used in the material and structural analysis as well as in quality assurance. The products are used in the analysis of cement, metals, steel, plastics, polymers, pharmaceutical and petrochemical products, industrial minerals, glass, catalysts, semiconductors, thin films and new materials, recycling and environmental materials used.

PANalytical employs around 900 people worldwide. Our own research, development and manufacturing facilities are located in the Netherlands, Japan and the United States. Own sales and service structures it has in more than 60 countries. PANalytical GmbH, responsible for sales and service in Germany, has its headquarters in Kassel.

Up to the sale in 2002 under the name Philips PANalytical was Analytical a division of Philips. The company is now part of Spectris plc. based in England.

In 2011, PANalytical is a strategic partnership with EADS subsidiary Sodern ( Limeil- Brevannes, France), a manufacturer of Neutronenaktivierungsanalysatoren, received. The CNA - systems (English Controlled Neutron Activation) are used for on-line control of mass flows. The element contents of the materials (eg limestone ) are measured directly on the conveyor belt from the quarry to the processing and so the total amount of the stream is detected.

In 2012, Analytical Spectral Devices was (ASD Inc. ), a manufacturer of high-performance analytical NIR systems were adopted. ASD develops, manufactures and markets NIR measurement systems and applications for industry and research.

History

To the product portfolio includes systems and software products that are developed and marketed.

Products

Spectrometer for X-ray fluorescence analysis (XRF or English. XRF)

Wavelength ( WDXRF, also WDX ) - or energy dispersive (EDXRF, even EDX) X-ray fluorescence spectrometers are used for the elemental analysis of solid or liquid samples. Here, a possible homogenized sample is excited by X- radiation for emission of element-specific fluorescence, which is then dissolved, and detects the wavelength or energy dispersive. The intensity of the measured fluorescence is proportional to the element concentration. By calibration against appropriate standards or a Fundamentalparamter standardless approach the element composition of a sample can be determined within a short time. There are a variety of different X-ray tube types available, which are produced in- tube factory.

Wavelength-dispersive spectrometer sequence ( WDXRF system)

The developed since the 1930s technology is to separate the element-specific fluorescence radiation, a so-called mechanical goniometer, the Analytlinien sequentially ( sequential) be approached. By a continuous scanning of the Gonimeters and recording of all measuring points of a complete spectrum can be generated. The advantage of wavelength-dispersive technique lies in the very good resolution for light elements and the corresponding proof of strong detection.

Wavelength-dispersive multichannel spectrometer ( WDXRF system)

Simultaneous spectrometers are designed specifically for ultra-fast analysis. By default channels (small fixed goniometer ) for each component, which are measured at the same time, high precision and very fast multi-element analysis is achieved. Measurement times usually only a few seconds. Additional installation of scanners for the expansion of the element spectrum possible. Typically integrated into an automated, wherein the sample preparation is carried out automatically.

Energy dispersive X-ray spectrometer (EDXRF ) system

Development since the 1970s. In contrast to the wavelength dispersive fluorescence analysis, the element-specific fluorescence radiation is not separated by a goniometer with the energy-dispersive technique, but directly in the detector (usually semiconductor detector ) and split the electronic energy. This can be done in a compact structure. The resulting intensities per energy allocated to the relevant items in a development program. The intensities and count rates behave as in the WDXRF proportional to concentration. Advantages here are the low electrical power consumption and the gentle material analysis.

X-ray diffraction (XRD)

In the X-ray is examined on the basis of Bragg equation, the properties of crystalline structure of matter. For this purpose, a fixed or liquid sample with X-rays of a specific wavelength is irradiated at different angles. The sample bends on the model of geometrical optics, the incident radiation to the existing crystalline structures (levels or the electron density centers) and the diffracted beam can be detected at an equal distance to the X-ray tube on the goniometer circle by a detector. This results in a diffraction pattern with specific individual reflections, the angle of the position and intensity is thus a function of the phases present and the crystal structure.

In addition to the qualitative phase analysis, that is, the determination of the phases present, is today often also the quantitative phase analysis the focus of investigations. The introduction of the semiconductor detector X'Celerator PANalytical has revolutionized the so-called powder diffraction in 2000. While conventional diffractometer take up to an hour or more to receive meaningful data are data with the semiconductor detector in front after just a few minutes. Even shorter cycle times with better resolution are achieved with the new generation of these detectors, the Pixcel. The latest version PIXcel3D even allows two -dimensional measurements and computed tomography images.

PANalytical has in addition to products for the production and quality control in powder samples ( CubiX3 ) and systems for research and development on offer. With the systems of the X'Pert PRO series, the company has realized a modular concept already over 10 years ago, which allows adjustment-free reconstruction of systems from one to another measurement geometry. The current system Empyrean, this technique still further perfected.

• X'Pert powder ( X-ray diffraction for the analysis of powder samples in reflection and transmission )
• X'Pert PRO MRD ( Material Research Diffractometer ) ( design for a complete analysis of solid samples with options for residual stress analysis, texture analysis, grazing incidence measurements, in-plane geometries, analysis of rocking curves and reciprocal space maps)
• CubiX3 ( compact theta - theta diffractometer for the industry standard, and phase analysis )
• Empyrean (fully modular system with vertical goniometer for performing virtually any task in the field of X-ray diffraction: phase analysis, small angle scattering, non -ambient analysis, texture and stress analysis, high-resolution diffraction, reflectometry, tomography )

PANalytical has its own X-ray tube factory near Eindhoven ( NL), where not only the X-ray tubes are designed and produced for their own consumption, but also those for OEM partners.

Prompt - gamma neutron activation analysis ( PGNAA )

Under the name " CNA " (English Controlled Neutron Analyser ) distributes the French company Sodern distributes under license by PANanalytical different gauges of the immediate gamma neutron activation analysis. In this method, the sample material is excited on the conveyor belt by a neutron source and the gamma - rays of the activated material is measured at suitable detectors. The ability of neutrons interacting with the deeper layers of the sample, enabled the direct capture of larger mass flows. The main application areas of CNA devices are in addition to the cement industry ( " CNA Cement ") of nickel, copper and iron ore mining and coal analysis in power plants.

But conducted its first commercial devices with so-called neutron tube, which generated only when an operating voltage neutrons. Thus, this source is switched off. It consists of the reservoir of deuterium and tritium. From these reservoirs of deuterium and tritium atoms to be accelerated with a high voltage relative to one another and come into collision This results in addition to helium and neutrons. In the older, conventional technology, the radioactive isotope Cf -252 is used which releases continuously neutrons. The neutron flux of the neutron tube is connected to an electronic control kept constant, while the active emitter continuously loses activity over the half-life. The neutron tube has compared to the permanent spotlight also a much lower degree of radioactivity.

Another feature of the neutron tube, the pulsed excitation. Neutrons are released in a short pulse and interact with the material. Thus, the gamma radiation of the different processes ( scattering, prompt and delayed radiation) used time -resolved and optimized. This technique allows the determination of very light elements such as oxygen or carbon

Near-infrared ( NIR)

Under the product name " FieldSpec ", " Labspec " and " Terraspec " PANalytical sells about ASD Inc. transportable measuring devices for near-infrared spectroscopy (NIR ) spectroscopy, with the can be examined, among other things, the moisture, fat and protein content of a material. Typical areas of application are the raw material analysis, the study of pharmaceutical products and the review of foods. Furthermore, can be determined with it mineral types of rocks. Especially on this application aligned spectrometer form the core markets of ASD: Remote sensing and exploration and production in the mining sector.