Built-in-self-test

Built in self test (BIST ) means that an electronic device has an integrated test circuit which generates test signals and usually compares well with predetermined proper response signals, so that the test result of an ATE (Automatic Test Equipment) can be output. Built in self tests are becoming easier to implement by means of automated design processes and take up relatively little space in the newer high number of switching elements, but reduce the material and time spent in testing considerably. They are also used for regular self-test of processors during their application or when switching on and off in order to detect malfunctions in time and to avoid consequential damage.

There are different types of built in self tests:

  • Analog and mixed-signal BIST
  • Boundary Scan Test
  • Logic BIST
  • Processor BIST
  • Signature analysis
  • Memory BIST - for example, with the algorithm Marinescu
  • Electrical Measurement
Electronic circuit
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