Transmission line measurement

The transfer line method ( also transfer length method or transfer length measurement ) is a method of the semiconductor and materials sciences and refers to the measurement of the contact resistance with the help of a two-dimensional test structure. The method was first introduced in 1964 by the physicist William Shockley. It is now often a related method to determine the contact resistances of semiconductor and metal layers in, for example, the micro system technology.

• Electrical Measurement