Boundary Scan Description Language

The Boundary Scan Description Language (short: BSDL ) is a language for describing boundary scan test capabilities JTAG -compatible electronic components. The boundary-scan test is a test of electronic components, can be detected with the defective component pins or broken links on a circuit board. Originally defined in 1149.1b - 1994 " Supplement to IEEE Std 1149.1-1990, IEEE standard test access port and boundary-scan architecture" BSDL is now part of the 1149.1-2001 " IEEE standard test access port and boundary-scan architecture".

BSDL is based on a simplified VHDL language syntax to describe, through which the boundary scan test capabilities to an electronic device has. This description is provided by the manufacturers as. Bsdl file available. These files are used by Boundary Scan tools to to generate test programs for boundary scan tests on block or board level, or they are used in the hardware error diagnosis.

A BSDL file contains a list of all existing in the block boundary scan cells and describes how these are connected to the block pins, which function they have and how they can be used in a boundary scan test. The BSDL file also contains the features supported by the device JTAG instructions and their opcodes. Often also data concerning with the use of the JTAG ports are contained to be observed features. This can be, for example special reset conditions.