Grazing incidence diffraction

The X-ray diffraction at grazing incidence (English grazing incidence X - ray diffraction, GIXRD, sometimes just grazing incidence diffraction GID for ) is a special measuring method, the X-ray diffraction, which is based on the X-ray diffraction.

Description

It is characterized by a very shallow angle of incidence of X-rays on the sample from ( α <3 °; seen from the surface of the sample). The aim is to analyze in this way only a small as possible volume of the sample to obtain data on films with little background. The conventional Theta/2-Theta-Verfahren obtained due to the penetration depth of the X-ray information of up to a millimeter of the sample, that is to a large extent the properties of the underlying substrate. Due to the very shallow angle of incidence of the X-ray radiation at GIXRD be captured by the X-ray layer volume decreases. The evanescent wave penetrates only slightly into the material. For even smaller angle ( 0-0.6 degrees) can even examine the surface of the thin film.